The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Feb. 18, 2022
Hitachi, Ltd., Tokyo, JP;
So Sasatani, Tokyo, JP;
Tsuyoshi Kitamura, Tokyo, JP;
Hitachi, Ltd, Tokyo, JP;
Abstract
A position measurement system comprises: a plurality of imaging means for capturing images of an own position-detecting measured object having an own position detection unit and another measured object having no own position detection unit; an own position measurement means for obtaining the position of the own position-detecting measured object on the basis of own position information from the own position detection unit; an image analysis means for estimating the positions of the own position-detecting measured object and the other measured object for each of the images; and a position determination means which compares the position of the own position-detecting measured object measured by the own position measurement means with the position of the own position-detecting measured object estimated by the image analysis means for each of the captured images, and which determines one of the positions of the other measured object estimated for the respective captured images.