The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

May. 21, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Ryosaku Shino, Tokyo, JP;

Kenichi Kamijo, Tokyo, JP;

Shota Ohtsuka, Tokyo, JP;

Tatsu Kimura, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/55 (2017.01); G06T 1/60 (2006.01); G06T 15/00 (2011.01); H04N 23/63 (2023.01);
U.S. Cl.
CPC ...
G06T 7/55 (2017.01); G06T 1/60 (2013.01); G06T 15/005 (2013.01); H04N 23/631 (2023.01); H04N 23/634 (2023.01); G06T 2200/24 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/20101 (2013.01); G06T 2207/30096 (2013.01); G06T 2207/30101 (2013.01);
Abstract

An image processing deviceX includes a three-dimensional reconstruction meansX, a matching meansX, and an output control meansX. The three-dimensional reconstruction meansX generates reconstruction data Mr acquired by three-dimensionally reconstructing an inspection target on a basis of captured images Ic which a photographing unit provided in an endoscope generates by photographing the inspection target. The matching meansX performs matching between a standard model 'Ms', which is a standard three-dimensional model of the inspection target, and the reconstruction data Mr. The output control meansX displays on a display deviceX a photographed area indication image indicating a photographed area of the inspection target on the standard model based on a result of the matching.


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