The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Jan. 30, 2023
Applicant:

Toyota Motor Engineering & Manufacturing North America, Inc., Plano, TX (US);

Inventors:

Emrah Akin Sisbot, Mountain View, CA (US);

Seyhan Ucar, Mountain View, CA (US);

Takamasa Higuchi, Mountain View, CA (US);

Yongkang Liu, Mountain View, CA (US);

Kentaro Oguchi, Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/50 (2017.01); G06V 10/25 (2022.01); G06V 20/56 (2022.01);
U.S. Cl.
CPC ...
G06T 7/50 (2017.01); G06V 10/25 (2022.01); G06V 20/588 (2022.01); G06T 2207/30256 (2013.01);
Abstract

Systems and methods are provided to determine optimal (image analysis) parameters for generating or adapting/adjusting a monocular depth estimation (MDE) depth map based on various factors, such as vehicle operating conditions, environmental conditions, road conditions, etc. After determining the optimal parameters to use, the optimal parameters can be stored on a cloud server or an edge server along with the vehicle location for use when another vehicle approaches the location to perform MDE without needing to independently determine the optimal parameters to use. Moreover, the use of such optimal image analysis parameters, enable a richer/enhanced view of the environment/area around or about a vehicle, where image analysis parameters may be used to more accurately interpret or otherwise characterize a depth map.


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