Defect analysis device, defect analysis method, non-transitory computer-readable medium, and learning device

Abstract

A defect analysis device includes a model storage unit configured to store a learned model in which teacher information representing positions, shapes, and sizes of a plurality of defects embedded in a standard test piece is associated with detection information of the plurality of defects detected based on a plurality of standard ultrasonic images acquired from the standard test piece, a target image acquisition unit configured to acquire a plurality of target ultrasonic images from an inspection target, and an enhanced image creation unit configured to create a plurality of enhanced images emphasizing the plurality of defects based on the learned model and the plurality of target ultrasonic images, in which the learned model is learned by giving a priority to defects to be detected among the plurality of defects in each standard ultrasonic image.