The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Mar. 30, 2023
Applicant:

Woven BY Toyota, Inc., Tokyo, JP;

Inventor:

Akira Wakatsuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A method for inspecting image annotation quality in an annotated image dataset, the method including: obtaining an annotated image dataset; implementing a first inspection of X % of the annotated image dataset, the first inspection including at least one of first categories of annotation inspections; implementing a second inspection of a sample of the annotated image dataset, the second inspection including at least one of second categories of annotation inspections; and identifying errors in the annotated image dataset using the first inspection and the second inspection.


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Wakatsuki, Akira. (2026). Methods and non-transitory computer readable storage medium for image annotation quality assurance (U.S. Patent No. 12573016). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12573016

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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