The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
May. 08, 2025
Morgan Stanley Services Group Inc., New York, NY (US);
Anshuman Behera, Kearny, NJ (US);
Raka Rajanigandha, Jersey City, NJ (US);
Vidhan Janak Dhagai, Mumbai, IN;
Mazeed Ahamed Mohammed, Anantapur, IN;
Sujit Eapen, Plainsboro, NJ (US);
Morgan Stanley Services Group Inc., New York, NY (US);
Abstract
A computer-implemented method of assessing a large language model (LLM) includes receiving user inputs concerning the LLM including selected hyperparameters, a use case, at least one prompt, and examples. The user inputs are mapped with a glossary of metrics to determine recommended metrics and recommended prompts for the LLM. A minimum recommended sample size is determined based on the user inputs, recommended at least one metric and expected confidence and accuracy. An LLM-generated dataset related to the use case is augmented when it is determined that the LLM-generated dataset has fewer entries than the minimum recommended sample size. An evaluation report is then generated for assessing the recommended at least one metric for determining the accuracy of: i) the LLM based on the user inputs, recommended at least one metric and the LLM-generated dataset, ii) the at least one user prompt, and iii) at least one recommended prompt.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile