The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Oct. 09, 2020
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Rui Wang, Xian, CN;
Jing James Xu, Xian, CN;
Xiao Ming MA, Xian, CN;
Si Er Han, Xian, CN;
Lei Gao, Xian, CN;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01);
Abstract
Performing a goal-seek analysis of spatial-temporal data by generating a hierarchical cluster according to spatial temporal data, determining a spatial-temporal location input for a target, determining spatial-temporal predictor values for the spatial-temporal location, and adjusting the hierarchical cluster according to and the spatial-temporal predictors.
Wang, Rui. (2026). Goal-seek analysis with spatial-temporal data (U.S. Patent No. 12572792). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12572792
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile