The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Sep. 14, 2022
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventors:

Shantanu Rane, Palo Alto, CA (US);

Bashir Sadeghi, East Lansing, MI (US);

Alejandro E. Brito, Mountain View, CA (US);

Assignee:

Genesee Valley Innovations, LLC, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/2451 (2023.01); G06F 18/2132 (2023.01); G06F 18/2137 (2023.01);
U.S. Cl.
CPC ...
G06F 18/2451 (2023.01); G06F 18/21375 (2023.01); G06F 18/21326 (2023.01);
Abstract

One embodiment provides a method and system which facilitates optimizing a pair of affine classifiers based on a diversity metric. During operation, the system defines a diversity metric based on an angle between decision boundaries of a pair of affine classifiers. The system includes the diversity metric as a regularization term in a loss function optimization for designing the pair of affine classifiers, wherein the designed pair of affine classifiers are mutually orthogonal. The system predicts an outcome for a testing data object based on the designed pair of mutually orthogonal affine classifiers.


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