The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Aug. 30, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventor:

Kouta Nakata, Tokyo, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/2133 (2023.01); G06F 18/21 (2023.01); G06F 18/2132 (2023.01); G06F 18/23 (2023.01);
U.S. Cl.
CPC ...
G06F 18/2133 (2023.01); G06F 18/21322 (2023.01); G06F 18/217 (2023.01); G06F 18/23 (2023.01);
Abstract

According to one embodiment, a data analyzing apparatus acquires data containing the number N of analysis target samples (where N is an integer larger than or equal to 2). The apparatus performs a matrix factorization upon the data to factorize the data into the number K of basis samples and the number K of weights corresponding to the number K of basis samples (where K is an integer larger than or equal to 2), and fixes part of the K basis samples to specific basis samples in the matrix factorization.


Find Patent Forward Citations

Nakata, Kouta. (2026). Data analyzing apparatus, method and storage medium (U.S. Patent No. 12572621). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12572621

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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