The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Jan. 19, 2022
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventors:
Hiroyuki Kataya, Yamanashi-ken, JP;
Yasumichi Sakoda, Yamanashi-ken, JP;
Assignee:
FANUC CORPORATION, Yamanashi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3485 (2013.01); G06F 3/04182 (2019.05); G06F 3/044 (2013.01);
Abstract
A diagnosis device according to one embodiment of the present invention includes: a signal strength acquisition unit that acquires the signal strength of each of a plurality of nodes that divide a touch panel; and a noise level determination unit that determines a noise level on the basis of the state of the signal strengths under a touch detection threshold, among the acquired signal strengths.
Kataya, Hiroyuki. (2026). Diagnosis device for determining noise level (U.S. Patent No. 12572443). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12572443
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile