The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Jun. 07, 2023
Applicant:

Rockley Photonics Limited, Altrincham, GB;

Inventors:

Shreyas Y. Shah, Pasadena, CA (US);

Jeffrey Driscoll, San Jose, CA (US);

Jin-Hyoung Lee, Yorba Linda, CA (US);

Aaron John Zilkie, Pasadena, CA (US);

Assignee:

Rockley Photonics Limited, Altrincham, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
G02B 6/12007 (2013.01);
Abstract

Echelle gratings with a shared free propagation region. In some embodiments, a system includes: a first echelle grating; and a second echelle grating. The first echelle grating may include: a first input waveguide having an end on a first Rowland circle; a first grating on the first Rowland circle; and a first output waveguide having an end on the first Rowland circle. The second echelle grating may include: a second input waveguide having an end on a second Rowland circle; a second grating on the second Rowland circle; and a second output waveguide having an end on the second Rowland circle. The second input waveguide may be separate from the first input waveguide, the second output waveguide may be separate from the first output waveguide, and the first Rowland circle may overlap the second Rowland circle.


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