The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

May. 16, 2022
Applicant:

Aeva, Inc., Mountain View, CA (US);

Inventors:

Jose Krause Perin, Mountain View, CA (US);

Esha John, Sunnyvale, CA (US);

Kumar Bhargav Viswanatha, Santa Clara, CA (US);

Mina Rezk, Haymarket, VA (US);

Rajendra Tushar Moorti, Mountain View, CA (US);

Assignee:

Aeva, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/4912 (2020.01); G01S 7/491 (2020.01); G01S 7/497 (2006.01); G01S 17/34 (2020.01); G01S 17/66 (2006.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4912 (2013.01); G01S 7/491 (2013.01); G01S 7/497 (2013.01); G01S 17/34 (2020.01); G01S 17/66 (2013.01); G01S 17/931 (2020.01);
Abstract

A light detection and ranging (LIDAR) system performs a method including generating a frequency domain waveform based on a baseband electrical signal in a time domain, wherein the frequency domain waveform includes a spectrum of frequencies and determining a likelihood metric for the spectrum of frequencies of the frequency domain waveform. The method further includes in response to one or more parameters associated with the frequency domain waveform satisfying a condition, modifying the likelihood metric for the spectrum of frequencies based on the one or more parameters associated with the frequency domain waveform to generate a modified likelihood metric for the spectrum of frequencies, selecting a peak frequency from the frequency domain waveform corresponding to a frequency with the highest value for the modified likelihood metric, and determining one or more properties of a target based at least in part on the selected peak frequency.


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