The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Sep. 27, 2023
Beijing Huafeng Test & Control Technology Co., Ltd., Beijing, CN;
Ning Ju, Beijing, CN;
Xiaotong Zhang, Beijing, CN;
BEIJING HUAFENG TEST & CONTROL TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The disclosure relates to a tester, a test control device and a test control method. The device comprises a parallel control unit and a plurality of station control units, wherein each of the station control units corresponds to at least one device under test. The parallel control unit is connected with the station control units and a host respectively and is configured to receive test items sent by the host and send each of test sequences in the test items to a station control unit corresponding to a device under test corresponding to the test sequence. Each of the station control units is connected with a plurality of function boards respectively, wherein functions realized by the function boards are different. Any station control unit is configured to send received test sequence(s) to corresponding function boards according to functions required to realize for the received test sequence(s).