The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Jan. 10, 2024
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Florian Huber, Munich, DE;

Florian Galler, Mering, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0878 (2013.01);
Abstract

A measurement device, e.g., a vector network analyzer, for analyzing a device-under-test, DUT is provided. The measurement device comprises a signal generator to generate a test signal; test ports, connected to the DUT, which forward the test signal to the DUT, and/or receive a response signal from the DUT; and signal paths electrically connected the signal generator by one of the test ports. At least one of the signal paths comprises: a measurement unit to measure RF signals; a reference coupler to forward a decoupled portion of the test signal; a first measurement coupler to forward a first decoupled portion of the response signal; and a second measurement coupler to forward a second decoupled portion of the response signal. The second measurement coupler adapts a characteristic of the second decoupled portion of the response signal to differ from the first decoupled portion of the response signal.


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