The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Dec. 26, 2022
Deyuan Technology Co., Ltd., Chengdu, CN;
Qiuping MA, Chengdu, CN;
Bin Gao, Chengdu, CN;
Liang Shen, Chengdu, CN;
Fei Luo, Chengdu, CN;
Shiqiang Jiang, Chengdu, CN;
Yong Zhang, Chengdu, CN;
Deyuan Technology Co., Ltd., Chengdu, CN;
Abstract
An eddy current testing circuit, method and system, a storage medium, and a terminal belong to the technical field of eddy current non-destructive testing. A dual-path differential probe is formed mainly by combining a differential bridge and a transformer conditioning circuit, and relationships between amplitudes, phase parameters and lift-off respectively generated under alternating magnetic fields are analyzed by using signal parameters generated by a first differential signal and a second differential signal under respective alternating magnetic fields. Multi-parameter signal fusion is performed, so that the lift-off can be suppressed, and dual-path differential output achieves a high testing capability for defects under high lift-off change.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile