The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
May. 02, 2022
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Kai Ritschel, Heuchelheim, DE;
Christian Schumann, Lich, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A control system for automatedly determining an illumination intensity of at least one light source of a fluorescence microscope is provided. The control system is configured to automatedly determine, after a change in a light path, a control value for the illumination intensity of the at least one light source in order to achieve a desired value of an inspection parameter characterizing sample inspection. The light path comprises at least one of: an illumination path from the at least one light source to the sample and an imaging path from the sample to at least one detector. Determining the control value is based on: (i) a value of the illumination intensity that was set before the change in the light path, (ii) a value of the inspection parameter used before the change in the light path, and (iii) a physical model of the light path.