The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Sep. 15, 2022
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Charles Rimbert-Riviere, Soest, DE;

Simon Kornprobst, Stephanskirchen, DE;

Soumya Susovita Nayak, Munich, DE;

Ernst-Roland Sittner, Warstein, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3563 (2014.01); G01N 21/74 (2006.01); G01N 25/72 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); G01N 21/74 (2013.01); G01N 25/72 (2013.01); G01N 2021/3572 (2013.01); G01N 2021/745 (2013.01);
Abstract

An apparatus for detecting cracks in a plurality of samples includes: a temperature source configured to heat or cool a section of the samples; one or more infrared cameras positioned near one or both sides of the samples and configured to receive infrared image data from the samples; a data acquisition and processing unit configured to generate a two-dimensional image out of the infrared image data to detect cracks in the samples; and a conveyor unit configured to transport the samples past the temperature source and the one or more infrared cameras.


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