The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Sep. 09, 2020
Nec Corporation, Tokyo, JP;
Akira Tsuji, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An abnormality detection system includes: shape data acquisition means for acquiring shape data of a surface of a structure; surface direction calculation means for calculating a direction in which the surface is facing based on the shape data; shape data division means for dividing the shape data based on the direction in which the surface is facing calculated by the surface direction calculation means; reference shape calculation means for calculating a reference shape for each of the pieces of the shape data divided by the shape data division means; and abnormality detection means for detecting an abnormality on the surface of the structure based on a difference between each of the pieces of the shape data divided by the shape data division means and the reference shape corresponding to each of the pieces of the shape data calculated by the reference shape calculation means.