The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Jan. 31, 2023
Applicant:

Phc Holdings Corporation, Tokyo, JP;

Inventors:

Masahiro Kouge, Ehime, JP;

Takumi Shima, Ehime, JP;

Masato Nishiyama, Saitama, JP;

Kouji Watanabe, Ehime, JP;

Masaki Yamamoto, Ehime, JP;

Kenta Nakamae, Ehime, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01);
U.S. Cl.
CPC ...
C12M 41/30 (2013.01);
Abstract

A sensor unit has sensors for measuring the components of a culture medium in a culture vessel, and comprises a plurality of sensors and a linking portion. The plurality of sensors each have a main body and a sensing unit disposed on the lower end side of the main body and immersed in the culture medium to measure the components of the culture medium. The linking portion links the plurality of sensors on the upper end side of the main body.


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Kouge, Masahiro. (2026). Sensor unit and cell culture analysis device having same (U.S. Patent No. 12570946). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12570946

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