The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
Dec. 21, 2020
Dow Global Technologies Llc, Midland, MI (US);
Sanjib Biswas, Lake Jackson, TX (US);
Rahul Sharma, Lake Jackson, TX (US);
Jacquelyn A. Degroot, Freeport, TX (US);
Erica Spiekermann, Freeport, TX (US);
Douglas S. Ginger, Lake Jackson, TX (US);
Jian Wang, Freeport, TX (US);
Mehmet Demirors, Pearland, TX (US);
David T. Gillespie, Pearland, TX (US);
Hien Q. Do, Lake Jackson, TX (US);
Philip P. Fontaine, Lake Jackson, TX (US);
Dow Global Technologies LLC, Midland, MI (US);
Abstract
Embodiments of a polyethylene composition are provided, which may include a first polyethylene fraction comprising at least one peak in a temperature range of from 35° C. to 70° C. in an elution profile via improved comonomer composition distribution (iCCD) analysis method, where a first polyethylene area fraction is an area in the elution profile from 35° C. to 70° C., and where the first polyethylene fraction area comprises from 25% to 65% of the total area of the elution profile; and a second polyethylene fraction comprising at least one peak in a temperature range of from 85° C. to 120° C. in the elution profile, where a second polyethylene area fraction is an area in the elution profile from 85° C. to 120° C., and where the second polyethylene fraction area comprises at least 20% of the total area of the elution profile.