The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
May. 21, 2021
Carl Zeiss Meditec Ag, Jena, DE;
Hartmut Vogelsang, Oberweser, DE;
Dan Zoltan Reinstein, London, GB;
Christian Deutsch, Weimar, DE;
Ingo Wundrich, Weimar, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A method for aligning a system for laser-based ametropia correction relative to a patient's eye to be treated is disclosed. Predefined pre-operative measurement data which characterize at least predetermined structures of the patient's eye is provided. The predetermined structures include a part of the patient's eye to be treated. In addition, the method includes measuring at least one part of the predetermined structures of the patient's eye using an OCT system immediately before and/or during treatment for ametropia correction of the patient's eye and providing OCT measurement data, and comparing the OCT measurement data and the predefined pre-operative measurement data and preparing comparative data. The method also includes ascertaining a position and/or orientation of the part of the patient's eye to be treated relative to the system and aligning the system relative to the patient's eye using the ascertained position and/or orientation of the part of the patient's eye.