The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2026
Filed:
May. 10, 2022
Karl Storz SE & Co. KG, Tuttlingen, DE;
Ralf Brinkmann, Luebeck, DE;
Birgit Lange, Luebeck, DE;
KARL STORZ SE & Co. KG, Tuttlingen, DE;
Abstract
A measuring method for optically determining a distance (z) of a surface located in a medium from an end of an optical waveguide is described and has the following steps: emitting electromagnetic measuring radiation of a first wavelength (λ1) and of a second wavelength (λ2) from the end of the waveguide towards the surface, wherein the medium more strongly absorbs the electromagnetic measuring radiation of the second wavelength (λ2) than the electromagnetic measuring radiation of the first wavelength (λ1); measuring a first reflection signal (I) of the electromagnetic measuring radiation of the first wavelength (λ1) reflected from the surface, and measuring a second reflection signal (I) of the electromagnetic measuring radiation of the second wavelength (λ2) reflected from the surface, and determining the distance (z) from a ratio (I:I) of the second and the first reflection signal. Furthermore, a measuring device and a laser lithotripsy device are described.