The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2026

Filed:

Oct. 01, 2024
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Raj Rakshit, Kolkata, IN;

Anwesha Khasnobish, Kolkata, IN;

Annesha Mazumder, Kolkata, IN;

Arijit Chowdhury, Kolkata, IN;

Tapas Chakravarty, Kolkata, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/0507 (2021.01); G01S 13/89 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0507 (2013.01); G01S 13/89 (2013.01); A61B 2562/0228 (2013.01);
Abstract

The usage of microwave imaging for biomedical (BMWI) applications is still challenging due to the imprecise reconstruction of the relative permittivity of tissues and the ill-posed inverse scattering problem. Anomaly detection in biological tissues demand in-vivo, non-invasive, and non-contact measurements. Considering and proving the anomaly as a point object in the microwave imaging is erroneous and results in false implications about the anomaly's presence, location, and characteristics. Present disclosure provides systems and methods for anomaly detection in biological tissues. An intensity map of target region is generated to detect tumor. Area around the tumor is processed to obtain a refined image. As the tumor is embedded in tissues of higher dielectric constant, image thus formed is larger in size than actual tumor. An iterative numerical computation method is implemented to estimate relative permittivity. Subsequently, the effective size of the anomaly is approximately estimated, which is close to their actual values.


Find Patent Forward Citations

Loading…