The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Sep. 27, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Dongchan Kim, Suwon-si, KR;

Dongnam Byun, Suwon-si, KR;

Jaewook Shin, Suwon-si, KR;

Jinyoung Hwang, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/60 (2023.01); G06T 7/246 (2017.01); G06T 7/55 (2017.01); G06T 7/73 (2017.01); H04N 23/63 (2023.01);
U.S. Cl.
CPC ...
H04N 23/64 (2023.01); G06T 7/246 (2017.01); G06T 7/55 (2017.01); G06T 7/73 (2017.01); H04N 23/633 (2023.01); G06T 2207/10016 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30244 (2013.01);
Abstract

Provided are a method and an electronic device for generating a point cloud. The method includes obtaining, from at least one sensor of the electronic device, first sensing data corresponding to an object, obtaining a first point cloud corresponding to the object, based on the first sensing data, identifying, by using at least one artificial intelligence model, at least one outlier point indicating violation of at least one predefined rule in the first point cloud, and providing a re-photographing location guide for re-photographing the object, based on the at least one outlier point.


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