The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Jul. 07, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Youngkwon Lim, Allen, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 11/02 (2006.01); H04N 19/14 (2014.01); H04N 19/18 (2014.01);
U.S. Cl.
CPC ...
H04N 19/14 (2014.11); H04N 19/18 (2014.11);
Abstract

An apparatus includes a communication interface and a processor operably coupled to the communication interface. The processor is configured to receive, via the communication interface, a bitstream including complexity metrics (CM) metadata. The processor is also configured to extract information in the CM metadata from the bitstream, wherein the information includes a direct indication of a number of coding units (CUs) in the bitstream that have non-zero transform coefficients, for each CU size of a plurality of CU sizes. The processor is further configured to predict a decoding complexity of the bitstream based on information in the CM metadata.


Find Patent Forward Citations

Lim, Youngkwon. (2026). Evc decoding complexity metrics (U.S. Patent No. 12568224). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12568224

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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