The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Apr. 13, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Peniel Charles, Bangalore, IN;

Manikandan Sethuraman, Bangalore, IN;

Amudha Krishnasamy, Bangalore, IN;

Venkata Adireddy Padala, Shrewsbury, MA (US);

Vighneshwar Hegde, Bangalore, IN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 45/24 (2022.01); H04L 45/28 (2022.01);
U.S. Cl.
CPC ...
H04L 45/24 (2013.01); H04L 45/28 (2013.01);
Abstract

An apparatus comprises a processing device configured to detect one or more performance anomalies associated with a given path interconnecting a given host device and a storage system, to identify a set of two or more checkpoints characterizing health of the given path, and to determine a health status for each checkpoint in the identified set of two or more checkpoints. The processing device is also configured to determine a root cause of the detected one or more performance anomalies associated with the given path based at least in part on the determined health status of the checkpoints in the identified set of two or more checkpoints, and to control, via a given multi-path input-output driver of the given host device, processing of input-output operations on the given path based at least in part on the determined root cause of the detected one or more performance anomalies.


Find Patent Forward Citations

Charles, Peniel. (2026). Multi-path layer configured for performing root cause analysis of path anomalies (U.S. Patent No. 12568040). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12568040

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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