The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Dec. 19, 2022
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Joel P. Dunsmore, Sebastopol, CA (US);

Tuan Tang, Santa Clara, CA (US);

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 21/24 (2006.01); H01Q 3/26 (2006.01); H01Q 3/28 (2006.01); H01Q 3/38 (2006.01); H04B 17/12 (2015.01);
U.S. Cl.
CPC ...
H01Q 21/24 (2013.01); H01Q 3/267 (2013.01); H01Q 3/28 (2013.01); H01Q 3/38 (2013.01); H04B 17/12 (2015.01);
Abstract

A system for measuring and calibrating an antenna array having a plurality of antenna array elements each configured to individually radiate signals is described. The system includes an antenna array controller comprising a memory that stores instructions and a processor that executes the instructions. When executed by the processor, the instructions cause the system to: measure a magnitude and phase of each of a set of antenna array elements; and compensate for leakage of other antenna array elements of the set of antenna array elements.


Find Patent Forward Citations

Dunsmore, Joel. (2026). Antenna array measurement and calibration (U.S. Patent No. 12567681). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12567681

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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