The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Jun. 03, 2022
Applicant:

Aeye, Inc., Pleasanton, CA (US);

Inventor:

Barry Behnken, Monument, CO (US);

Assignee:

AEye, Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08G 5/74 (2025.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G08G 5/74 (2025.01); G01S 17/89 (2013.01);
Abstract

Embodiments of the present disclosure relate generally to terrain mapping, and more particularly to a method and system for maintaining a normalized view of a terrain during an airborne data collection process. Embodiments include an intelligent sensing methodology that, on a near-real time basis, continually monitors the geometry and instantaneous height of the immediate region (voxel) under collection by an airborne sensor, thus maintaining complete, continual situational awareness of the topography under investigation. In this manner, swath asymmetries and occlusions resulting from pronounced elevation peaks can be fully assessed, quantified, and remedied at the terminus of and/or during each scan. In some embodiments, this is done by adjusting the platform's collection system scan parameters (e.g. by adjusting a scan angle for the affected direction) on a scan-by-scan basis to eliminate such asymmetries and occlusions from each collection swath.


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