The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Oct. 08, 2022
Nuctech Company Limited, Beijing, CN;
Li Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Ming Chang, Beijing, CN;
Xin Jin, Beijing, CN;
Qingping Huang, Beijing, CN;
Xiaofei Xu, Beijing, CN;
Mingzhi Hong, Beijing, CN;
Liguo Zhang, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
A method of acquiring feature information of a detected object is provided, including: controlling the detected object to pass through a detection apparatus; controlling an imaging system to perform radiation scanning on the detected object acquiring a radiation scanning image of the detected object acquiring feature information of the detected object through the radiation scanning image. The detected object includes a first part, a detection part and a second part sequentially in a first direction. The acquiring feature information of the detected object through the radiation scanning image includes: acquiring a first boundary line between the detection part and the first part and a second boundary line between the detection part and the second part through the radiation scanning image; and calculating a dimension between the first boundary line and the second boundary line in the first direction to acquire a dimension of the detection part in the first direction.