The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Apr. 28, 2023
Applicant:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Inventor:

Raghavendra Tenkasi Shankar, Manorville, NY (US);

Assignee:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06T 7/70 (2017.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G06T 19/00 (2013.01); G06T 7/70 (2017.01); G06V 10/761 (2022.01); G06T 2219/012 (2013.01);
Abstract

A method in a computing device includes: capturing, via a depth sensor, a first point cloud depicting an object; determining, from the first point cloud, a first attribute of a plane corresponding to a surface of the object; monitoring, via a motion sensor, an orientation of the depth sensor; in response to detecting a change in the orientation that meets a threshold, capturing a second point cloud depicting the object; determining, from the second point cloud, a second attribute of the plane corresponding to the surface of the object; determining whether the first attribute and the second attribute match; and when the first attribute and the second attribute match, dimensioning the object based on at least one of the first point cloud and the second point cloud.


Find Patent Forward Citations

Tenkasi Shankar, Raghavendra. (2026). Multipath artifact avoidance in mobile dimensioning (U.S. Patent No. 12567210). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12567210

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…