The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Oct. 28, 2022
GE Precision Healthcare Llc, Wauwatosa, WI (US);
Gireesha Chinthamani Rao, Pewaukee, WI (US);
Ravi Soni, San Ramon, CA (US);
Gopal B. Avinash, Concord, CA (US);
Poonam Dalal, Brookfield, WI (US);
Chen Liu, Mountain View, CA (US);
Molin Zhang, Cambridge, MA (US);
Zita Herczeg, Szeged, HU;
GE Precision Healthcare LLC, Wauwatosa, WI (US);
Abstract
An artificial intelligence (AI) measurement system for an X-ray image is employed either as a component of the X-ray imaging system or separately from the X-ray imaging system to automatically scan post-exposure X-ray images to detect and locate various landmarks of the anatomy presented within the X-ray image. A set of key image features approximating the locations of the landmarks having known distance relationships to one another is overlaid onto the X-ray image. The positions of the key image features are then adjusted to correspond to the landmarks within the X-ray image. These adjustments are made relative to the prior known distance relationships between the key features, which enables the measurement system to readily calculate desired angular and length measurements between landmarks as a result.