The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Apr. 28, 2020
Mitsubishi Electric Corporation, Tokyo, JP;
Yuichi Ikeda, Tokyo, JP;
Yotaro Nakane, Tokyo, JP;
Akira Minezawa, Tokyo, JP;
Kohei Okahara, Tokyo, JP;
Yukihiro Toku, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
An appearance inspection apparatus includes an imaging unit, a reconstructed image generation unit, and an image comparison unit. The imaging unit images an object. The reconstructed image generation unit generates a reconstructed image by using a model, the reconstructed image being an image to be obtained by reconstruction of an input image, image data on the object imaged by the imaging unit being used as the input image, the model being used for attempting to reproduce the image data. The image comparison unit generates a difference image corresponding to a difference between the input image and the reconstructed image.