The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Jun. 12, 2025
Samsara Inc., San Francisco, CA (US);
Reed Phillip Desrosiers, San Francisco, CA (US);
Joseph Kovach, Mill Valley, CA (US);
Ashcon Zand, Philadelphia, PA (US);
Ikechukwu Muyiwa Eshiokwu, Toronto, CA;
Ho Chi Andrew Chin, Miami, FL (US);
Ehsan Joseph Razfar, San Francisco, CA (US);
Xiaodong Tian, Issaquah, WA (US);
Matthew Lee Basham, Oakland, CA (US);
Samsara Inc., San Francisco, CA (US);
Abstract
A technique for quality enforcement in equipment inspection processes through automated validation of user assessment data can involve receiving evaluator user data, including the present location of an evaluator device and evaluator credentials, and receiving user assessment data regarding the condition of specified equipment. Evaluator user data can be compared with the location data corresponding with the specified equipment, to yield a determination, based on the comparison, an indication of an accuracy of the user assessment data of the condition of the specified equipment. Such a technique can help ensure that equipment inspections are conducted with appropriate rigor and accuracy by implementing multiple layers of verification and quality control measures.