The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Sep. 22, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Steven Joseph Kurtz, Austin, TX (US);

Michael Henry Sitko, Jericho, VT (US);

Rahul M. Rao, Bangalore, IN;

Sanjay Upreti, Lexington, KY (US);

Ajith Kumar Madathil Chandrasekaran, Bangalore, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/327 (2020.01); G06F 30/337 (2020.01); G06F 119/02 (2020.01); G06F 119/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/327 (2020.01); G06F 30/337 (2020.01); G06F 2119/02 (2020.01); G06F 2119/10 (2020.01);
Abstract

A method, system, and computer program product are disclosed for implementing enhanced noise impact on function (NIOF) analysis of an IC design having nets in multiple different variable voltage domains next to each other and modeling all multiple worst-case victim-aggressor voltage configurations in a single run leveraging noise abstracts characterized at a single voltage corner. The NIOF analysis enables accurately identifying incorrect victim switching or functional fails, effectively and efficiently providing design verification and the ability to sign-off an IC design with a single run, and enable modifying an integrated circuit design to fix NIOF failures, and fabricating an integrated circuit.


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