The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Dec. 15, 2021
Micro Focus Llc, Santa Clara, CA (US);
Gerald E. Sullivan, Roswell, GA (US);
Justin Michael Alwine, Alpharetta, GA (US);
Peter Thomas Blay, Santa Clara, CA (US);
Nidhi Govindram Kejriwal, Pleasanton, CA (US);
Micro Focus LLC, Santa Clara, CA (US);
Abstract
Testing software applications often requires a balancing of thoroughness versus the time and computing resources available to perform such tests. By performing a static analysis on candidate software source code and, from the static analysis, configuring a dynamic analysis component to execute the tests, allows for extraneous tests to be omitted. For example, performing certain vulnerability attacks on a function may be futile if the attack requires a string input but the function only accepts integers. By combining static and dynamic analysis, unnecessary tests may be omitted and the results of each analysis process correlated to identify actual vulnerabilities or falsely indicted vulnerabilities reported by one of the static or dynamic analysis component.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile