The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Sep. 24, 2024
Applicant:

Sri International, Menlo Park, CA (US);

Inventors:

Ajay Divakaran, Monmouth Junction, NJ (US);

Yi Yao, Princeton, NJ (US);

Julia Kruk, Rego Park, NY (US);

Jesse Hostetler, Boulder, CO (US);

Jihua Huang, Sunnyvale, CA (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 16/9024 (2019.01);
Abstract

In general, various aspects of the techniques are directed to causal analysis using large scale time series data. A computing system may convert large scale time series data to first time period records and second time period records according to a multi-scale time resolution. The computing system may implement a hierarchical machine learning model to generate embeddings that capture temporal characteristics of features of the large scale time series data. The computing system may generate a graph data structure indicating cause and effect correlations between features of the large scale time series data based on temporal dynamics captured in the cause and second time period records and/or the embeddings.


Find Patent Forward Citations

Loading…