The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Jan. 11, 2024
Applicant:

Rafay Systems, Inc., Sunnyvale, CA (US);

Inventors:

Bheema Sarat Chandra Kaki, San Francisco, CA (US);

Stephan Benny, Pleasanton, CA (US);

Hanumantha Rao Kavuluru, San Jose, CA (US);

Haseeb Siddique Budhani, Menlo Park, CA (US);

Assignee:

Rafay Systems, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/14 (2013.01);
Abstract

A method to manage a distributed computing machine comprising: configuring a cluster to provide compute and memory resources to run one or more containers that include computer program code to perform operations of the distributed computing machine; configuring one or more cloud-based components to interact with the distributed computing machine; recording in memory storage media, cloud-based component information that indicates events in which the distributed computing machine and the one or more cloud-based components interact; recording in memory storage media, activity metrics information indicating activity level within the distributed computing machine; using the cloud-based component information and the activity metrics information to train one or more machine learning models to represent behavior of the distributed computing machine.


Find Patent Forward Citations

Kaki, Bheema Sarat Chandra. (2026). System and method for application orchestration, observation, and fault remediation (U.S. Patent No. 12566668). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12566668

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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