The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Oct. 24, 2023
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Yuncong Chen, Plainsboro, NJ (US);

Luan Tang, Cranbury, NJ (US);

Yanchi Liu, Monmouth Junction, NJ (US);

Zhengzhang Chen, Princeton Junction, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Assignee:

NEC Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/0793 (2013.01); G16H 50/20 (2018.01);
Abstract

Methods and systems for anomaly detection include encoding a multivariate time series and a multi-type event sequence using respective transformers and an aggregation network to generate a feature vector. Anomaly detection is performed using the feature vector to identify an anomaly within a system. A corrective action is performed responsive to the anomaly to correct or mitigate an effect of the anomaly. The detected anomaly can be used in a healthcare context to support decision making by medical professionals with respect to the treatment of a patient. The encoding may include machine learning models to implement the transformers and the aggregation network using deep learning.


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