The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Dec. 22, 2023
Applicant:

Dell Products, L.p., Round Rock, TX (US);

Inventors:

Suresh K. Krishnan, Shrewsbury, MA (US);

Ramesh Doddaiah, Westborough, MA (US);

Mikhail Salnikov, Franklin, MA (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0766 (2013.01); G06F 11/0745 (2013.01);
Abstract

Systems and methods for time-series based machine learning anomaly detection and prevention are described. In an illustrative, non-limiting embodiment, an Information Handling System (IHS) may include: a processor; and a memory coupled to the processor, where the memory includes program instructions store thereon that, upon execution by the processor, cause the IHS to: obtain communication data associated with the IHS for a plurality of time windows, including a particular time window, and previous time windows before the particular time window; determine, using a machine learning model, that the communication data for the particular time window includes an anomaly; and based on the determination, perform one or more actions. In some embodiments, the program instructions further cause the IHS to: based on the communication data, determine time-series data for a plurality of attributes of the communication data; and determine that an attribute includes an outlier in the particular time window.


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