The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Dec. 16, 2021
Applicant:

Intuit Inc., Mountain View, CA (US);

Inventor:

Prateek Anand, San Diego, CA (US);

Assignee:

Intuit Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/445 (2018.01); G06N 7/01 (2023.01);
U.S. Cl.
CPC ...
G06F 9/445 (2013.01); G06N 7/01 (2023.01);
Abstract

A method implements last mile churn prediction. The method includes retrieving data during a user session in response to a trigger. The data includes a list of screen identifiers and a corresponding list of timestamps. The method further includes converting the list of timestamps to a list of time deltas. The list of time deltas includes a time delta that identifies an amount of time between two timestamps of the list of timestamps. The method further includes generating a churn risk from the list of screen identifiers and the list of time deltas. The churn risk identifies a probability that the user session will be terminated. The method further includes transmitting an intervention to intervene in the user session based on the churn risk.


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Anand, Prateek. (2026). Last mile churn prediction (U.S. Patent No. 12566615). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12566615

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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