The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Jun. 20, 2023
Applicant:
Inter-university Research Institute Corporation Research Organization of Information and Systems, Tokyo, JP;
Inventors:
Ichiro Hasuo, Tokyo, JP;
Yuichiro Oyabu, Tokyo, JP;
Clovis Eberhart, Tokyo, JP;
Kohei Suenaga, Tokyo, JP;
Kenta Cho, Tokyo, JP;
Shinya Katsumata, Tokyo, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/40 (2018.01); G06F 8/41 (2018.01); G06F 9/30 (2018.01);
U.S. Cl.
CPC ...
G06F 8/443 (2013.01); G06F 9/30058 (2013.01);
Abstract
A sampling device includes a memory and a processor configured to execute selecting a control flow corresponding to each branch in a probabilistic program; optimizing the program by applying predetermined transformation rules to the program of the selected control flow by back propagation; and generating samples according to the optimized program.