The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Aug. 19, 2022
Palantir Technologies Inc., Denver, CO (US);
Ezra Spiro, New York, NY (US);
Andre Frederico Cavalheiro Menck, New York, NY (US);
Anshuman Prasad, New York, NY (US);
Arthur Thouzeau, London, GB;
Caroline Henry, London, GB;
Charles Shepherd, London, GB;
Joanna Peller, London, GB;
Jennifer Yip, Wembley, GB;
Marco Diciolla, London, GB;
Matthew Todd, London, GB;
Peter Maag, Brooklyn, NY (US);
Spencer Tank, New York, NY (US);
Thomas Powell, London, GB;
Palantir Technologies Inc., Denver, CO (US);
Abstract
Sensor logs corresponding to a first machine are accessed. Each sensor log spans at least a first period. First computer readable logs corresponding to the first machine are accessed. Each computer readable log spans at least the first period, the computer readable logs include a maintenance log including maintenance task objects, each maintenance task object includes a time and a maintenance task type. A set of statistical metrics are derived from the sensor logs. A set of log metrics are derived from the computer readable logs. Using a risk model that receives the statistical metrics and log metrics as inputs, fault probabilities or risk scores indicative of one or more fault types occurring in the first machine within a second period are determined.