The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Jun. 27, 2023
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Mun Seob Lee, Daejeon, KR;

Sang Yun Kim, Daejeon, KR;

Chihoon Kim, Daejeon, KR;

Ji Won Park, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 3/00 (2006.01); H04N 23/957 (2023.01);
U.S. Cl.
CPC ...
G02B 3/0068 (2013.01); G02B 3/0031 (2013.01); G02B 3/0056 (2013.01); H04N 23/957 (2023.01);
Abstract

The present disclosure can effectively improve an angular image resolution and a spatial image resolution compared to the related art by solving a problem of a plenoptic image based on a microlens array according to the related art. In the case of the microlens array according to the related art, microlenses having different numerical apertures (NAs) and F # (F numbers) or focal lengths are positioned on one substrate. However, in the present disclosure, two or more microlens arrays having different NAs and F # are stacked in a layer form (all the microlenses of each microlens array are formed in the same F # and the same NA) to allow various F # and various NAs to be implemented, and thus an image of an object is formed on a sensor plane at different positions. Accordingly, a spatial resolution and a depth resolution increase.


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