The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Nov. 22, 2022
Applicant:

Himax Technologies Limited, Tainan City, TW;

Inventors:

Min-Chian Wu, Tainan City, TW;

Ting-Sheng Hsu, Tainan City, TW;

Ching-Wen Wang, Tainan City, TW;

Cheng-Che Tsai, Tainan City, TW;

Assignee:

Himax Technologies Limited, Tainan City, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/894 (2020.01); G01S 7/481 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G01S 17/894 (2020.01); G01S 7/4816 (2013.01); G01S 7/4817 (2013.01); G06T 7/521 (2017.01); G06T 2207/10028 (2013.01);
Abstract

A three-dimensional (3D) scanning system includes a projector that generates an emitted light projected on an object, a reflected light being reflected from the object; a sensor that generates image data according to the reflected light; and a depth processor that generates depth data according to the image data and at least one modified factor representing corresponding deviation amount between the image data and an ideal image data due to a circle of confusion caused by the reflected light passing a lens of the sensor and then irradiating a sense plane of the sensor out of focus.


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Wu, Min-Chian. (2026). 3d scanning system and method (U.S. Patent No. 12566272). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12566272

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