The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Feb. 29, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Gyuyeol Kim, Suwon-si, KR;

Jaewoong Choi, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/02 (2006.01); G01R 31/30 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31905 (2013.01); G01R 1/07342 (2013.01); G01R 31/3004 (2013.01);
Abstract

A test device includes a tester configured to provide a plurality of electrical signals to a device under test (DUT), and a probe card removably attached to the tester, the probe card including a plurality of channels and at least one detection circuit, where each of the plurality of channels includes a path through which a respective electrical signal of the plurality of electrical signals moves from the tester to the DUT, the at least one detection circuit is connected to one of the plurality of channels, and the at least one detection circuit is configured to determine whether the connected channel is defective.


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Quick Actions:

Kim, Gyuyeol. (2026). Test device and test method implementing the same (U.S. Patent No. 12566213). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12566213

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