The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Aug. 31, 2021
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Fumikazu Warashina, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/2518 (2013.01);
Abstract

This three-dimensional measurement device comprises: a projection unit that projects reference light to an object while performing scanning with the light; a light reception unit that receives the reference light reflected on the object; a time extent setting unit that sets a scanning time extent of the reference light in accordance with a distance-measuring range for each prescribed section of the light reception unit; and a three-dimensional information calculation unit that calculates three-dimensional information about the object W by means of triangulation based on information of the light reception unit within the set scanning time extent.


Find Patent Forward Citations

Warashina, Fumikazu. (2026). Three-dimensional measurement device (U.S. Patent No. 12566060). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12566060

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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