The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Oct. 15, 2019
Applicant:

The Board of Trustees of the University of Illinois, Urbana, IL (US);

Inventors:

J. Gary Eden, Champaign, IL (US);

Sung-Jin Park, Urbana, IL (US);

Andrey Mironov, Urbana, IL (US);

Jinhong Kim, Urbana, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/306 (2006.01); C23C 16/40 (2006.01); C23C 16/455 (2006.01); C23C 16/48 (2006.01); C23C 16/509 (2006.01); H01J 37/32 (2006.01); H01L 21/02 (2006.01); H05H 1/24 (2006.01); H05H 1/46 (2006.01);
U.S. Cl.
CPC ...
C23C 16/45544 (2013.01); C23C 16/403 (2013.01); C23C 16/45538 (2013.01); C23C 16/482 (2013.01); C23C 16/5093 (2013.01); H01J 37/32082 (2013.01); H01J 37/32091 (2013.01); H01J 37/32348 (2013.01); H01J 37/32366 (2013.01); H01J 37/32715 (2013.01); H01L 21/02274 (2013.01); H05H 1/24 (2013.01); H05H 1/2406 (2013.01); H05H 1/245 (2021.05); H05H 1/4645 (2021.05); H05H 1/466 (2021.05); H01J 2237/332 (2013.01); H01L 21/02175 (2013.01); H01L 21/02178 (2013.01); H01L 21/02205 (2013.01); H01L 21/0228 (2013.01);
Abstract

An in-chamber plasma source in a deposition reactor system includes an array of microcavity or microchannel plasma devices having a first electrode and a second electrode isolated from plasma in microcavities or microchannels. An inlet provides connection to deposition precursor. A region interacts deposition precursor with plasma. An outlet directs precursor dissociated with the plasma onto a substrate for deposition. A reactor system includes a substrate holder across from the outlet, a chamber enclosing the in-chamber plasma source and the substrate holder, an exhaust from the chamber, and conduit supplying precursors from sources or bubblers to the inlet. A reactor system can conduct plasma enhanced atomic layer deposition at high pressures and is capable of forming a complete layer in a single cycle.


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