The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2026

Filed:

Apr. 12, 2023
Applicant:

Jiangsu University, Jiangsu, CN;

Inventors:

Yunxia Ye, Jiangsu, CN;

Tonglin Mou, Jiangsu, CN;

Yabo Zhang, Jiangsu, CN;

Rui Zhao, Jiangsu, CN;

Zijie Dai, Jiangsu, CN;

Xudong Ren, Jiangsu, CN;

Assignee:

Jiangsu University, Jiangsu, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/354 (2014.01); B23K 103/08 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
B23K 26/354 (2015.10); G01R 29/0878 (2013.01); B23K 2103/08 (2018.08);
Abstract

The present disclosure provides a high-sensitivity terahertz sensor. The high-sensitivity terahertz sensor includes a substrate; a metal microstructure array, including a plurality of metal microstructure units, and covering the substrate to form a metasurface; and metal nanostructures, located at gaps of the metal microstructure array, where the metal microstructure array and the metal nanostructures are formed by etching a metal film on the substrate through pulsed laser direct writing. The present disclosure utilizes the metasurface and the metal nanostructures to cooperatively enhance the terahertz wave, promoting full interaction between the terahertz wave and the analyte and improving terahertz detection sensitivity.


Find Patent Forward Citations

Ye, Yunxia. (2026). Preparation method of high-sensitivity terahertz sensor (U.S. Patent No. 12564901). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12564901

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…