The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Dec. 31, 2024
Cilag Gmbh International, Zug, CH;
Reyhaneh Nosrati, Boston, MA (US);
Chad Steven Lape, Sr., Mason, OH (US);
Scott A. Jenkins, Mason, OH (US);
Francesca Mayhaus, Independence, KY (US);
Jorge Adrian Dayer Carrillo, Cincinnati, OH (US);
Carlos Ivan Ramirez Martinez, Juarez, MX;
Anu Ahuja, Raritan, NJ (US);
Saman Sarraf, San Jose, CA (US);
Cilag GmbH International, Zug, CH;
Abstract
An automated surgical staple inspection system automatically generates surgical staple inspection data characterizing a set of staples fired into a test skin by stapling device in a staple test. An inspection processing device obtains one or more images of the set of staples and applies an object detection model to infer locations of the staples and respective classes of the staples indicating whether the staples are properly formed or have one or more identified defects. Based on the inferred locations, staples may be mapped to respective positions in an expected staple pattern to generate a staple map. A keypoint detection model furthermore operates to automatically identify a set of keypoints in each staple from which staple height may be determined. The inspection processing device may generate one or more digital reports based on the inspection data, which may be outputted to a user interface of a user device.