The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2026
Filed:
Jul. 08, 2021
Forus Health Pvt. Ltd., Bangalore, IN;
Venkatakrishnan Srinivasan, Bangalore, IN;
Revathy Manthri Rangaraj, Bangalore, IN;
Subhajit Banerjee Purnapatra, Bangalore, IN;
Keerthighaan Kanagasegar, Bangalore, IN;
FORUS HEALTH PVT. LTD., Bangalore, IN;
Abstract
Objective refraction error measuring apparatuses are known. Once the measurement is done, there is no known method for confirming if the measurements are correct. Disclosed is an apparatus wherein once the error is measured, the determined values of the error are used to set the characteristics of a tunable lens so as to correct the error in the vision of the subject. The objective error is measured again while the subject viewing through the tunable lens so set. Objective refraction error is again measured. If the error measured is now within predefined limits, the first measurement is deemed correct and the values are out put so that glasses with those values may be prescribed to the subject.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile